Element analyzer

The VHX-7000 Digital Microscope, equipped with an elemental analyzer, provides advanced material characterization through Laser-Induced Breakdown Spectroscopy (LIBS). Its integrated AI identifies materials and their elemental composition, streamlining the process for users of all skill levels. The VHX-7000 is ideal for applications in quality control, failure analysis, and contamination identification across various industries. With high-resolution imaging and elemental analysis capabilities, it offers a comprehensive solution for modern material science challenges.

Surface Profiler

The VK-X3000 3D Surface Profiler is an advanced optical measurement system that combines three scanning technologies: laser confocal, white light interferometry, and focus variation. This triple scan approach enables high-accuracy measurement and analysis of a wide range of surfaces and materials. The VK-X3000 is capable of handling challenging targets, including transparent or mirrored surfaces, samples with large height variations, and steep angles.

Coordiante Measuring Machine

The XM-5000 is a cutting-edge handheld coordinate measuring machine (CMM) that revolutionizes 3D measurement capabilities. This portable device offers high-accuracy measurements with a maximum range of 2000 x 1200 x 1000 mm. Its innovative design uses infrared light and cameras for measurement, eliminating moving parts and enhancing durability. With its portability and versatility, the XM-5000 excels in various applications, including first article inspections, quality control, and in-machine measurements across different industries

Voltera - PCB printer

The Voltera V-One is an innovative desktop PCB printer designed for rapid prototyping of circuit boards.It enables in-house PCB prototyping in under an hour, offering faster iteration, IP protection, and hands-on learning opportunities. \ Its compact design and all-in-one capabilities make it suitable for various applications in education, research, and product development.

Test Automation - SMU Tester and Probe Cards

The Keysight B1500A semiconductor parameter analyzer is an all-in-one device characterization analyzer supporting IV, CV, pulse/dynamic IV and more. The mainframe and plug-in modules enable the characterization of most electronic devices, as well as materials, semiconductors, and active/passive components.

Raman Spectrometer

The XploRA PLUS Raman Microscope is a full optical microscope with SWIFT Raman Imaging and HORIBA’s OneClick easy Raman Analysis for detailed spectroscopy with maximum ease of use and speed.

Atomic Force Microscope

The MFP-3D Bio AFM sets the industry standard as the only bio-AFM that makes no compromises. It achieves high imaging resolution, force measurement performance, and application versatility while integrating with a full range of optical techniques.

Fourier Transform Infrared Spectrometer

The Thermo Nicolet 6700 incorporates extensive capabilities for handling optical filters, polarizers, and mirrors for specific applications through the OMNIC Software suite. It can perform time-based studies, rapid scans, and low-light-level measurements.

Probe card Silicon Wafer

A probe card is utilized to provide an electrical path between the test system (SMU) and circuits on a silicon wafer, thereby permitting testing and validation of the circuits at the wafer level.

Wafer Level Testing-Micromanipulator

The Micromanipulator 4060 Manual Probe Station is designed for ease of use in everyday failure analysis, device characterization, and reliability testing applications. The 4060 is the most efficient, stable, and reliable 150/200mm general-purpose probe station in the industry.

Talos F200i TEM

The Talos F200i is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. ITs standard X-Twin pole piece gap combined with a reproducibly performing electron column opens opportunities for high-res 2D and 3D characterization, in situ dynamic observations, and diffraction applications.